New Scanning Microscope identifies atoms as it scans

A new type of scanning transmission electron microscope (STEM) incorporating new aberration-correction technology focuses a beam of electrons on a spot smaller than a single atom -- more sharply and with greater intensity than previously possible. The STEM shoots an electron beam through a thin-film sample and scans the beam across the sample in subatomic steps. The microscope can actually identify atoms using electron energy-loss spectrometry as it scans. Atoms in the path of the beam absorb energy from some of its electrons to kick their own electrons into higher orbits. The amount of energy this takes is different for each kind of atom giving a unique fingerprint.

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